• Opto-Electronic Engineering
  • Vol. 42, Issue 11, 37 (2015)
LOU Shuqi*, BAI Jian, LU Qianbo, LIAN Wenxiu, and JIAO Xufen
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2015.11.007 Cite this Article
    LOU Shuqi, BAI Jian, LU Qianbo, LIAN Wenxiu, JIAO Xufen. Anti Light Disturbance Analysis of the Measurement of High Precision Micro Displacement[J]. Opto-Electronic Engineering, 2015, 42(11): 37 Copy Citation Text show less
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    LOU Shuqi, BAI Jian, LU Qianbo, LIAN Wenxiu, JIAO Xufen. Anti Light Disturbance Analysis of the Measurement of High Precision Micro Displacement[J]. Opto-Electronic Engineering, 2015, 42(11): 37
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