Background Suppression of LCD Mura Defect Using B-spline Surface Fitting

LI Kun; LI Hui; LIU Yunjie; LIANG Ping; LU Xiaopeng

doi:10.3969/j.issn.1003-501x.2014.02.006

Journals >Opto-Electronic Engineering >Volume 41 >Issue 2 >Page 33 > Article

Opto-Electronic Engineering
Vol. 41, Issue 2, 33 (2014)

Background Suppression of LCD Mura Defect Using B-spline Surface Fitting

LI Kun^1、*, LI Hui¹, LIU Yunjie², LIANG Ping², and LU Xiaopeng¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3969/j.issn.1003-501x.2014.02.006 Cite this Article

LI Kun, LI Hui, LIU Yunjie, LIANG Ping, LU Xiaopeng. Background Suppression of LCD Mura Defect Using B-spline Surface Fitting[J]. Opto-Electronic Engineering, 2014, 41(2): 33 Copy Citation Text

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References

[2] LU C J，TSAI D M. Automatic Defect Inspection for LCDs Using Singular Value Decomposition [J]. International Journal of Production Research(S0020-7543)，2005，43(21): 4589-4607.

[3] TSNENG Y H，TSAI D M. Defect Detection of Uneven Brightness in Low-contrast Images Using Basis Image Representation [J]. Pattern Recognition(S0031-3203)，2010，43(3): 1129-1141.

[5] OH J H，KWAK D M，LEE K B，et al. Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Threshohding [J]. Key Engineering Materials(S1662-9795)，2004，270/273: 233-238.

[6] LEE J，YOO S. Automatic Detection of Region-Mura Defect in TFT-LCD [J]. IEICE Transactions on Information and Systems(S0916-8532)，2004，87(10): 2371-2378.

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LI Kun, LI Hui, LIU Yunjie, LIANG Ping, LU Xiaopeng. Background Suppression of LCD Mura Defect Using B-spline Surface Fitting[J]. Opto-Electronic Engineering, 2014, 41(2): 33

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