• Journal of Inorganic Materials
  • Vol. 35, Issue 9, 1034 (2020)
Haifeng XU, Chengyi HOU*, Qinghong ZHANG, Yaogang LI*, and Hongzhi WANG
Author Affiliations
  • State Key Laboratory for Modification of Chemical Fibers and Polymer Materials, College of Materials Science and Engineering, Donghua University, Shanghai 201620, China
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    DOI: 10.15541/jim20190550 Cite this Article
    Haifeng XU, Chengyi HOU, Qinghong ZHANG, Yaogang LI, Hongzhi WANG. Preparation and Thermoelectric Performance of Tellurium Nanowires-based Thin-Film Materials[J]. Journal of Inorganic Materials, 2020, 35(9): 1034 Copy Citation Text show less
    Schematic illustration for the preparation of the Te nanowire and flexible film
    1. Schematic illustration for the preparation of the Te nanowire and flexible film
    FESEM images of Te nanowires obtained by the solution without ascorbic acid at (a) 140, (b)160, (c) 180 and (d) 200 ℃, and with ascorbic acid at (e) 140, (f) 160, (g) 180 and (h) 200 ℃
    2. FESEM images of Te nanowires obtained by the solution without ascorbic acid at (a) 140, (b)160, (c) 180 and (d) 200 ℃, and with ascorbic acid at (e) 140, (f) 160, (g) 180 and (h) 200 ℃
    XRD pattern of TN160 film
    3. XRD pattern of TN160 film
    (a) Low-magnification, (b) high-magnification TEM images and (c) Fourier transformation pattern of TN160
    4. (a) Low-magnification, (b) high-magnification TEM images and (c) Fourier transformation pattern of TN160
    (a) Seebeck coefficients, (b) electrical conductivities, (c) power factors of Te nanowire films prepared under different conditions; Surface FESEM images of (d) ATN160 and (g) TN160 films with insets showing corresponding cross-sectional FESEM images; Digital photos of film (1 cm×2 cm) resistance tests for (e) ATN160 and (f) TN160 films
    5. (a) Seebeck coefficients, (b) electrical conductivities, (c) power factors of Te nanowire films prepared under different conditions; Surface FESEM images of (d) ATN160 and (g) TN160 films with insets showing corresponding cross-sectional FESEM images; Digital photos of film (1 cm×2 cm) resistance tests for (e) ATN160 and (f) TN160 films
    (a-d) Digital photos of film (1 cm×2 cm) resistance test and (e-h)FESEM surface images of TN160 film (a, e) without and with wet press at (b, f)10, (c, g) 20, (d, h) 30 MPa; (i, k) Cross-sectional and (j, l) high-magnification cross-sectional FESEM images of TN160 films (i, j) without and (k, l) with wet press at 30 MPa
    6. (a-d) Digital photos of film (1 cm×2 cm) resistance test and (e-h)FESEM surface images of TN160 film (a, e) without and with wet press at (b, f)10, (c, g) 20, (d, h) 30 MPa; (i, k) Cross-sectional and (j, l) high-magnification cross-sectional FESEM images of TN160 films (i, j) without and (k, l) with wet press at 30 MPa
    (a) Electrical conductivity, (b) Seebeck coefficient and (c) power factor of TN160 film before and after wet press
    7. (a) Electrical conductivity, (b) Seebeck coefficient and (c) power factor of TN160 film before and after wet press
    Carrier concentration and carrier mobility of TN160 film with wet press at different pressures
    8. Carrier concentration and carrier mobility of TN160 film with wet press at different pressures
    Curve radius/cmElectrical conductivity/(S·m-1)Seebeck coefficient/(μV·K-1)Power factor/(μW·m-1∙K-2)
    476282.938
    2.0472282.037.5
    1.6465282.337.1
    1.2458282.036.4
    0.8448281.935.6
    Table 1. Flexibilities of TN160 film with wet press at 30 MPa
    Haifeng XU, Chengyi HOU, Qinghong ZHANG, Yaogang LI, Hongzhi WANG. Preparation and Thermoelectric Performance of Tellurium Nanowires-based Thin-Film Materials[J]. Journal of Inorganic Materials, 2020, 35(9): 1034
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