Inverse Heat Conduction Problem of Inherent Defect Based on the Levenberg-Marquardt Method

WANG Yan-wu; YANG Li; SUN Feng-rui

Journals >Opto-Electronic Engineering >Volume 35 >Issue 1 >Page 85 > Article

Opto-Electronic Engineering
Vol. 35, Issue 1, 85 (2008)

Inverse Heat Conduction Problem of Inherent Defect Based on the Levenberg-Marquardt Method

WANG Yan-wu^*, YANG Li, and SUN Feng-rui

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[in Chinese]

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DOI: Cite this Article

WANG Yan-wu, YANG Li, SUN Feng-rui. Inverse Heat Conduction Problem of Inherent Defect Based on the Levenberg-Marquardt Method[J]. Opto-Electronic Engineering, 2008, 35(1): 85 Copy Citation Text

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References

[1] Sahnoun S,Belattar S.Thermal non destructive testing study of a circular defect in plane structure[J].British Journal of NDT,2003,8(8):115-121

[2] SAKAGAMI T,KUBO S.Applications of pulse heating thermography and lock-in thermography to quantitative nondestructive evaluations[J].Infrared Physics & Technology,2002,43:211-218

[6] HSIEH C K,SU K U.A methodology of predicting cavity geometry based on scanned surface temperature data-prescribed surface temperature at the cavity side[J].ASME Journal of Heat Transfer,1980,102:324-329

[7] HSIEH C K,SU K U.A methodology of predicting cavity geometry based on the scanned surface temperature data-prescribed heat flux at the cavity side[J].ASME Journal of Heat Transfer,1981,103:42-46

[8] HUANG C H,CHAO B H.An inverse geometry problem in identifying irregular boundary configurations[J].International Journal of Heat and Mass Transfer,1997,40:2045-2053

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WANG Yan-wu, YANG Li, SUN Feng-rui. Inverse Heat Conduction Problem of Inherent Defect Based on the Levenberg-Marquardt Method[J]. Opto-Electronic Engineering, 2008, 35(1): 85

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