• Opto-Electronic Engineering
  • Vol. 43, Issue 9, 20 (2016)
FANG Chenyan1、2、3、*, HUANG Xiaoxian1、2、3, and YIN Dayi1、2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2016.09.004 Cite this Article
    FANG Chenyan, HUANG Xiaoxian, YIN Dayi. The Influence of Light Source’s Fluctuation of Xenon Lamp Integrating Sphere on Ultraviolet System Calibration[J]. Opto-Electronic Engineering, 2016, 43(9): 20 Copy Citation Text show less
    References

    [1] ZHANG Mingchao,SONG Huiying,ZHOU Yue,et al. Calibration of SBUV Corona Detection System [J]. Opto-Electronic Engineering,2010,37(4):135-140.

    [2] WANG Shurong , XING Jin , LI Futian. Spectral radiance responsivity calibration of ultraviolet remote sensing spectroradiometer in space using integrating sphere [J]. Optics and Precision Engineering,2006,14(2):185-190.

    [3] HUANG Yu,WANG Shurong,ZHANG Zhenduo,et al. Spectral irradiance calibration of remote sensing ultraviolet spectral radiometer in space [J]. Journal of Optoelectronics Laser,2008,19(4):466-469.

    [4] WALKER J H,CROMER C L. A Technique for improving the calibration of large-area sphere sources [J]. Proceedings of SPIE(S0277-786X),1991,1493:224-230.

    [5] HEATH D F. Large aperture spectral radiance calibration source for ultraviolet remote sensing instruments [J]. Proceedings of SPIE(S0277-786X),2003,4891:335-342.

    [6] ZHOU Shichun. Advanced Introduction to infrared optoelectronics engineering: 1st Edit [M]. Beijing:Science Press, 2014:60.

    [7] LI Qian,WANG Cheng,ZHA Jun,et al. Spectral Characteristic of Short-Arc Xenon Lamp and Application in Solar Simulators [J]. Spectroscopy and Spectral Analysis,2012,32(6):1447-1450.

    [8] YANG Yi′ou. Study on new internal trigger technology of the long arc-xenon lamp for high-power solar simulator [D]. Shanghai:Shanghai Jiao Tong University,2013:1-25.

    FANG Chenyan, HUANG Xiaoxian, YIN Dayi. The Influence of Light Source’s Fluctuation of Xenon Lamp Integrating Sphere on Ultraviolet System Calibration[J]. Opto-Electronic Engineering, 2016, 43(9): 20
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