A new method of speckle metrology techniques called optical flow analysis is proposed based on dynamic scene analysis. From a new point of view, the probability of using the concept of image sequence processing to analyse speckle patterns is discussed in detail. It is proved that if speckle patterns do not meet the constrained conditions for optical flow analyses, a multichannel image processing method can be used to change the continued distribution of images to expand the measurement range. With classical metrology techniques, speckle patterns must be processed in spatial frequency domains. But by using optical flow analyses, speckle patterns can be directly processed in spatial domains. It provides a new way to reach the real-time measurement of speckle patterns.