• Laser & Optoelectronics Progress
  • Vol. 56, Issue 22, 222301 (2019)
Wenchao Ma1、2, Wen Shen1、2, Dongting Hu1、2, Xinyu Liu1、2, Ziyun Zhao1、2, Shuo Cao1、2, Zhouping Su1、2, Huaxin Zhu1、2, Yixin Zhang1、2, Guoqing Chen1、2, and Lifa Hu1、2、*
Author Affiliations
  • 1School of Science, Jiangnan University, Wuxi, Jiangsu 214122, China
  • 2Jiangsu Provincial Research Center of Light Industry Opto-Electronic Engineering and Technology, Wuxi, Jiangsu 214122, China
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    DOI: 10.3788/LOP56.222301 Cite this Article Set citation alerts
    Wenchao Ma, Wen Shen, Dongting Hu, Xinyu Liu, Ziyun Zhao, Shuo Cao, Zhouping Su, Huaxin Zhu, Yixin Zhang, Guoqing Chen, Lifa Hu. Phase Modulation Characteristics of LCSLM and Its Applications in Aspheric Surface Measurements[J]. Laser & Optoelectronics Progress, 2019, 56(22): 222301 Copy Citation Text show less
    Adaptive optical system of LCSLM
    Fig. 1. Adaptive optical system of LCSLM
    Experimental pictures. (a) Picture applied to LCOS; (b) picture taken by CCD2
    Fig. 2. Experimental pictures. (a) Picture applied to LCOS; (b) picture taken by CCD2
    Measured values of SHWFS as a function of mode factor when different Zernike modes are applied to LCOS. (a) Wavefront PV measured by SHWFS; (b) wavefront RMS measured by SHWFS
    Fig. 3. Measured values of SHWFS as a function of mode factor when different Zernike modes are applied to LCOS. (a) Wavefront PV measured by SHWFS; (b) wavefront RMS measured by SHWFS
    Comparisons between theoretical and measured values in partial Zernike modes. (a) Measured results of 3rd term; (b) measured results of 4th term; (c) measured results of 5th term; (d) measured results of 6th term; (e) measured results of 25th term; (f) measured results of 34th term
    Fig. 4. Comparisons between theoretical and measured values in partial Zernike modes. (a) Measured results of 3rd term; (b) measured results of 4th term; (c) measured results of 5th term; (d) measured results of 6th term; (e) measured results of 25th term; (f) measured results of 34th term
    Maximum amplitude when different Zernike modes can be applied to LCOS with relative errors of 5%, 10%, and 15%
    Fig. 5. Maximum amplitude when different Zernike modes can be applied to LCOS with relative errors of 5%, 10%, and 15%
    Zernike coefficient Cm measured by SHWFS when different Zernike modes are applied on LCOS and coefficient Cg is different. (a) Measured results of 3rd term; (b) measured results of 4th term; (c) measured results of 5th term; (d) measured results of 6th term; (e) measured results of 25th term; (f) measured results of 34th term
    Fig. 6. Zernike coefficient Cm measured by SHWFS when different Zernike modes are applied on LCOS and coefficient Cg is different. (a) Measured results of 3rd term; (b) measured results of 4th term; (c) measured results of 5th term; (d) measured results of 6th term; (e) measured results of 25th term; (f) measured results of 34th term
    Offset of light spot when tilt mode has different amplitudes
    Fig. 7. Offset of light spot when tilt mode has different amplitudes
    Diffraction efficiency at different amplitudes of tilt mode. (a) Diffraction efficiency as a function of coefficient; (b) diffraction efficiency as a function of QL
    Fig. 8. Diffraction efficiency at different amplitudes of tilt mode. (a) Diffraction efficiency as a function of coefficient; (b) diffraction efficiency as a function of QL
    Principle of optical path of aspherical surface measurement
    Fig. 9. Principle of optical path of aspherical surface measurement
    Aspherical surface shapes and its test hologram. (a) Aspherical surface shape; (b) surface shape after removing best matched spherical surface; (c) phase hologram
    Fig. 10. Aspherical surface shapes and its test hologram. (a) Aspherical surface shape; (b) surface shape after removing best matched spherical surface; (c) phase hologram
    Wenchao Ma, Wen Shen, Dongting Hu, Xinyu Liu, Ziyun Zhao, Shuo Cao, Zhouping Su, Huaxin Zhu, Yixin Zhang, Guoqing Chen, Lifa Hu. Phase Modulation Characteristics of LCSLM and Its Applications in Aspheric Surface Measurements[J]. Laser & Optoelectronics Progress, 2019, 56(22): 222301
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