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    Journals >Acta Optica Sinica >Volume 7 >Issue 7 >Page 622 > Article
    • Acta Optica Sinica
    • Vol. 7, Issue 7, 622 (1987)
    Multivariate error analysis in ellipsometric determination of optical thin film parameters
    ZHAN YUANLING and WANG LI
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    ZHAN YUANLING, WANG LI. Multivariate error analysis in ellipsometric determination of optical thin film parameters[J]. Acta Optica Sinica, 1987, 7(7): 622 Copy Citation Text show less
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    ZHAN YUANLING, WANG LI. Multivariate error analysis in ellipsometric determination of optical thin film parameters[J]. Acta Optica Sinica, 1987, 7(7): 622
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