[1] Erik Novak, Chiayu Ai, James C. Wyant. Errors caused by nearly parallel optical elements in a laser Fizeau interferometer utilizing strictly coherently imaging [C]. SPIE, 1997, 3134:456～460

[2] Zhiqiang Liu, Takeshi Gemma, Saori Udagawa et al.. Double-source interferometry for reducing spurious noise fringes [C]. SPIE, 2004, 5531:193～202

[3] Joe Shiefman. Using software to model coherent metrology systems [C]. SPIE, 2003, 5174:69～82

[5] Peter de Groot. Grating interferometer for flatness testing [J]. Opt. Lett., 1996, 21(3):228～230

[6] Katsuyuki Okada, Hironobu Sakuta, Teruji Ose et al.. Separate measurements of surface shapes and refractive index inhomogineity of an optical element using tunable-source phase shifting interferometry [J]. Appl. Opt., 1990, 29(22):3280～3285

[7] Leslie L. Deck. Multiple surface phase shifting interferometry [C]. SPIE, 2001, 4451:424～431

[8] Leslie L. Deck. Fourier-transform phase-shifting interferometry [J]. Appl. Opt., 2003, 42(13):2354～2365

[9] Claude Roddier, Francois Roddier. Interferogram analysis using Fourier transform techniques [J]. Appl. Opt., 1987, 26(9):1668～1673