The CCD noise from imaging process brings error to the results of optical measurement, so that noise suppression is a key to improve measurement accuracy. The characteristic of dark current noise and random noise is analyzed, and noise calibration and suppression techniques to each component are proposed respectively. The influence of CCD noise on optical measurement tasks, such as edge location and phase extraction of structural-light phase-shift method, is investigated. Simulation and experimental results show that the edge location accuracy is greatly improved by means of CCD noise calibration and suppression. Therefore, the validity and necessity of the proposed method is well confirmed.