• Frontiers of Optoelectronics
  • Vol. 2, Issue 2, 187 (2009)
Changkui HU1、2、* and Deming LIU1
Author Affiliations
  • 1College of Optoelectronic Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China
  • 2School of Science, Wuhan University of Technology, Wuhan 430070, China
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    DOI: 10.1007/s12200-009-0027-7 Cite this Article
    Changkui HU, Deming LIU. Polarization characteristics of subwavelength aluminum wire grating in near infrared[J]. Frontiers of Optoelectronics, 2009, 2(2): 187 Copy Citation Text show less

    Abstract

    Rigorous coupled wave analysis (RCWA) was used to investigate the polarization characteristics of subwavelength aluminum wire grating in near infrared. Upon exposure to the atmosphere, a layer of Al2O3 forms rapidly on the aluminum wires, so the effect of metal oxide layers on the polarization properties is modeled and analyzed. It is shown that subwavelength aluminum wire grating with oxide layers forming on the wires still offers excellent polarization properties. As the thickness of the oxide layer increases, the transmission coefficient increases, but the extinction ratio decreases. In addition, a magnesium fluoride (MgF2) layer was proposed to deposit between the aluminum wires and the substrate to enhance transmission coefficient. The theoretical research shows that subwavelength aluminum grid grating has high transmission coefficient and extinction ratio in near infrared, as well as uniform performance with wide variations in the angle of incidence. These features with their small size make it desirable for use in optical communication and allow more compact component designs.
    Changkui HU, Deming LIU. Polarization characteristics of subwavelength aluminum wire grating in near infrared[J]. Frontiers of Optoelectronics, 2009, 2(2): 187
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