Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
LASER
optical coherence tomography
confocal
OAM
polarization
Journals >
Laser & Optoelectronics Progress >
Volume 60 >
Issue 14 >
Page 1410014 > Article
Laser & Optoelectronics Progress
Vol. 60, Issue 14, 1410014 (2023)
Micro-CT Image Denoising Algorithm Based on Deep Residual Encoding-Decoding
Huijuan Fu
1
, Xiaoqi Xi
1
, Yu Han
1
, Lei Li
1
, Xinguang Wang
2
, and Bin Yan
1、*
Author Affiliations
1
College of Information System Engineering, Information Engineering University, Zhengzhou 450001, Henan, China
2
Henan Provincial Institute of Cultural Heritage and Archaeology, Zhengzhou 450001, Henan, China
show less
DOI:
10.3788/LOP221785
Cite this Article
Set citation alerts
Huijuan Fu, Xiaoqi Xi, Yu Han, Lei Li, Xinguang Wang, Bin Yan. Micro-CT Image Denoising Algorithm Based on Deep Residual Encoding-Decoding[J]. Laser & Optoelectronics Progress, 2023, 60(14): 1410014
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: Jun. 16, 2024
The article is cited by
1
article(s) CLP online library. (Some content might be in Chinese.)
Abstract
Get PDF(in Chinese)
Figures&Tables (8)
Equations (6)
References (22)
Cited By (1)
Get Citation
Copy Citation Text
Huijuan Fu, Xiaoqi Xi, Yu Han, Lei Li, Xinguang Wang, Bin Yan. Micro-CT Image Denoising Algorithm Based on Deep Residual Encoding-Decoding[J]. Laser & Optoelectronics Progress, 2023, 60(14): 1410014
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Image Processing
Received: Jun. 6, 2022
Accepted: Sep. 13, 2022
Published Online: Jul. 25, 2023
The Author Email: Yan Bin (ybspace@hotmail.net)
DOI:
10.3788/LOP221785
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm