Hui Yan, and Jingsong Wei, "False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments," Photonics Res. 2, 51 (2014)
- Photonics Research
- Vol. 2, Issue 2, 51 (2014)
Fig. 1. Schematic of the far-field external cavity feedback influence on an LD: (a) detailed external feedback structure, (b) effective internal LD structure.
Fig. 2. Relationship among P 2 R eff R 3 R 2 R eff R 3 P 2 R 3
Fig. 3. Geometric simplification of laser beam propagation at different sample positions: (a) before the focal plane, (b) on the focal plane, (c) after the focal plane.
Fig. 4. Normalized reflected light power P reflect
Fig. 5. Scheme of the z
Fig. 6. Relationship among LD output power, P noise z P noise z P noise
Fig. 7. Detailed illustration of the effective LD output with an attenuator.
Fig. 8. Relationship of R eff 2 P 2 z R 2 = 0.3 R eff 2 R 3 P 2 z
Fig. 9. Comparison of feedback influence with different attenuation values.
Fig. 10. Reduction of feedback light influence on open-aperture z z T z - scan / P noise
Fig. 11. Reduction of feedback light influence on closed-aperture z T z - scan / P noise
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