False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments

Hui Yan; and Jingsong Wei

doi:10.1364/PRJ.2.000051

Journals >Photonics Research >Volume 2 >Issue 2 >Page 51 > Article

Photonics Research
Vol. 2, Issue 2, 51 (2014)

False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments

Hui Yan^1、2 and and Jingsong Wei^1、*

Author Affiliations

¹Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.1364/PRJ.2.000051 Cite this Article Set citation alerts

Hui Yan, and Jingsong Wei. False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments[J]. Photonics Research, 2014, 2(2): 51 Copy Citation Text

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Hui Yan, and Jingsong Wei. False nonlinear effect in z-scan measurement based on semiconductor laser devices: theory and experiments[J]. Photonics Research, 2014, 2(2): 51

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