• Opto-Electronic Engineering
  • Vol. 38, Issue 7, 145 (2011)
WANG Ming-fu1、2、*, YANG Shi-hong1, WU Qin-zhang1, and XIA Mo1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2011.07.025 Cite this Article
    WANG Ming-fu, YANG Shi-hong, WU Qin-zhang, XIA Mo. Noise Performance Analysis of Electron Multiplying Device CCD60[J]. Opto-Electronic Engineering, 2011, 38(7): 145 Copy Citation Text show less

    Abstract

    The gain principle of EMCCD has been introduced and Total Signal-to-noise Ratio (SNR) formula has been induced based on mechanism of EMCCD noise. The sensitive detection capabilities of EMCCD which can be strongly influenced by readout noise have been weaken by electron multiplication function. It is necessary to minish the multiplication of EMCCD as much as possible to protect electron multiplying structure. CCD60 should be operated at inverted mode to obtain less total noise. This conclusion is a significant direction to EMCCD’s hardware circuits design.
    WANG Ming-fu, YANG Shi-hong, WU Qin-zhang, XIA Mo. Noise Performance Analysis of Electron Multiplying Device CCD60[J]. Opto-Electronic Engineering, 2011, 38(7): 145
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