Author Affiliations
1School of Electronic and optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China2School of Science, Nanjing University of Science and Technology, Nanjing 210094, Chinashow less
Fig. 1. Schematic diagram of binary search
Fig. 2. Schematic diagram of wavelet transform
Fig. 3. Time domain signal diagram. (a) Measured ultrasonic signal; (b) Ultrasonic signal after wavelet transform
Fig. 4. Signal processing result diagram. (a) Wavelet transform result of a priori experiment; (b) Reconstructed signal containing defect reflection signal
Fig. 5. Schematic diagram of numerical simulation structure
Fig. 6. Signal processing result diagram. (a) Simulation result difference diagram; (b) Compressed sensing recognition signal result diagram
Fig. 7. Simulated binary search result diagram. (a) Binary search schematic diagram; (b) Curve fitting result diagram
Fig. 8. Detection system diagram. (a) Detection system schematic diagram; (b) Detection system device diagram
Fig. 9. Schematic diagram of defect search settings
Fig. 10. Experimental results. (a), (c), (e) show that the preset area is on the left, in the middle (including defects) and on the right; (b), (d), (f) is the corresponding curve fitting diagram
Fig. 11. B-sweep results with 1 mm scanning step
Fig. 12. B-sweep results with 0.1 mm scanning step
Basis
point
| db6 | coif3 | sym5 | bior2.6 | y0 | 1 | 3.73 | 3.73 | 3.73 | 4.27 | 3.69 | 2 | 3.27 | 3.17 | 3.37 | 3.27 | 3.31 | 3 | 2.92 | 3.01 | 3.06 | 2.91 | 2.94 | 4 | 2.60 | 2.73 | 3.97 | 3.97 | 2.61 | 5 | 2.07 | 2.09 | 1.93 | 1.83 | 2.07 | 6 | 2.64 | 2.77 | 2.64 | 2.64 | 2.60 | 7 | 2.76 | 2.85 | 2.84 | 2.84 | 2.84 | 8 | 3.17 | 3.17 | 3.29 | 3.29 | 3.19 | 9 | 3.65 | 3.89 | 3.64 | 3.64 | 3.59 |
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Table 1. Comparison of automatic and manual identification results for different wavelet bases(Unit: ns)