• Chinese Journal of Lasers
  • Vol. 50, Issue 20, 2002106 (2023)
Zhaoyang Li1、2, Zhongliang Li2、3、*, Nan Nan2、**, Teng Liu2、3, Chenming Yang2、3, Xinjun Wan1, Yiheng Zhang2、3, and Xiangzhao Wang2、3
Author Affiliations
  • 1School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 2Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • show less
    DOI: 10.3788/CJL230449 Cite this Article Set citation alerts
    Zhaoyang Li, Zhongliang Li, Nan Nan, Teng Liu, Chenming Yang, Xinjun Wan, Yiheng Zhang, Xiangzhao Wang. Measurement Method of Keyhole Depth in Laser Welding Based on Polarization Sensitive OCT[J]. Chinese Journal of Lasers, 2023, 50(20): 2002106 Copy Citation Text show less
    Reflection of OCT detection beam in keyhole
    Fig. 1. Reflection of OCT detection beam in keyhole
    B-scan images of OCT scanning weld
    Fig. 2. B-scan images of OCT scanning weld
    Additional phase differences between s- and p-wave of reflected light from different metal surfaces versus angle of incidence
    Fig. 3. Additional phase differences between s- and p-wave of reflected light from different metal surfaces versus angle of incidence
    Schematics of keyhole simulation and simulation results. (a1)(a2) Light tracing for keyhole depth detection by PS-OCT; (b1)(b2) optical path difference of sub-rays before processing; (c1)(c2) optical path difference of sub-rays after processing
    Fig. 4. Schematics of keyhole simulation and simulation results. (a1)(a2) Light tracing for keyhole depth detection by PS-OCT; (b1)(b2) optical path difference of sub-rays before processing; (c1)(c2) optical path difference of sub-rays after processing
    Schematic of PS-OCT system
    Fig. 5. Schematic of PS-OCT system
    Keyhole sample and measured image. (a) Schematic of keyhole sample; (b) B-scan image of keyhole
    Fig. 6. Keyhole sample and measured image. (a) Schematic of keyhole sample; (b) B-scan image of keyhole
    M-scan images and additional phase difference images under different incidence conditions. (a) Vertical incidence on sidewall near bottom; (b) incidence on sidewall at 30° angle; (c) vertical incidence at bottom of keyhole
    Fig. 7. M-scan images and additional phase difference images under different incidence conditions. (a) Vertical incidence on sidewall near bottom; (b) incidence on sidewall at 30° angle; (c) vertical incidence at bottom of keyhole
    B-scan images and additional phase difference images at different positions of keyhole. (a) Sidewalls near bottom; (b) edge position of keyhole bottom; (c) middle position of keyhole bottom
    Fig. 8. B-scan images and additional phase difference images at different positions of keyhole. (a) Sidewalls near bottom; (b) edge position of keyhole bottom; (c) middle position of keyhole bottom
    ParameterValue
    AlCu
    Refractive index1.83+6.97i1.09+13.43i
    Keyhole depth /mm1.6501.700
    Keyhole width /mm22
    Spot diameter /m10-410-4
    Number of reflections66
    Number of lights10001000
    Roughness /m10-510-5
    Lens diameter /mm22
    Lens numerical aperture angle /(°)85-9585-95
    Table 1. Parameters used in simulation
    Zhaoyang Li, Zhongliang Li, Nan Nan, Teng Liu, Chenming Yang, Xinjun Wan, Yiheng Zhang, Xiangzhao Wang. Measurement Method of Keyhole Depth in Laser Welding Based on Polarization Sensitive OCT[J]. Chinese Journal of Lasers, 2023, 50(20): 2002106
    Download Citation