• Chinese Optics Letters
  • Vol. 13, Issue 2, 023101 (2015)
Yun Cui*, Hao Li, Kui Yi, and Jianda Shao
Author Affiliations
  • Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    DOI: 10.3788/COL201513.023101 Cite this Article Set citation alerts
    Yun Cui, Hao Li, Kui Yi, Jianda Shao. Moisture absorption characteristics of a SiO2 film from 2 to 3 μm[J]. Chinese Optics Letters, 2015, 13(2): 023101 Copy Citation Text show less
    Variations in the FTIR spectra of SiO2 coatings deposited by IBS as a function of heating temperature.
    Fig. 1. Variations in the FTIR spectra of SiO2 coatings deposited by IBS as a function of heating temperature.
    Variations in the FTIR spectra of SiO2 coatings deposited by EBE as a function of heating temperature.
    Fig. 2. Variations in the FTIR spectra of SiO2 coatings deposited by EBE as a function of heating temperature.
    Surface structures of the different substrates.
    Fig. 3. Surface structures of the different substrates.
    Surface structures of coatings deposited by IBS on different substrates.
    Fig. 4. Surface structures of coatings deposited by IBS on different substrates.
    Scanning electron microscopy (SEM) cross sectional morphology of a coating fabricated by IBS.
    Fig. 5. Scanning electron microscopy (SEM) cross sectional morphology of a coating fabricated by IBS.
    Surface structures of SiO2 coatings deposited by EBE on different substrates.
    Fig. 6. Surface structures of SiO2 coatings deposited by EBE on different substrates.
    SEM cross sectional morphology of a coating fabricated by EBE.
    Fig. 7. SEM cross sectional morphology of a coating fabricated by EBE.
    Mean pore sizes of the SiO2 coatings prepared by EBE on different substrates.
    Fig. 8. Mean pore sizes of the SiO2 coatings prepared by EBE on different substrates.
    Deposition MethodCoating MaterialSubstrateBaking Temperature (°C)Base Pressure (Pa)O2 Pressure (Pa)Thickness (μm)
    EBESiO2Fused quartz, silicon crystal, and alumina crystal3005×1031×1022
    IBS701×1044×1022
    Table 1. Parameters of the Coating Process
    SampleWavenumber (cm1)Wavelength (μm)Vibration ModeReferences
    Water32803.05Stretching OH Symmetric, ν1[9]
    34902.86Stretching OH Asymmetric, ν3
    Solid phase of water32003.13OH stretching of ice structure[10]
    Liquid phase of water34002.94OH stretching of liquid H2O structure
    Mesoporous silica34002.94OH in free H2O[11]
    36722.72OH in Si-OH
    Mesoporous silicon oxide32303.10OH stretching of ice-like structure[12]
    34002.94OH stretching of liquid H2O structure
    Table 2. Water Vibrations in the Mid-Infrared Spectral Region
    MaterialCoefficient of Thermal Expansion (106K)References
    Fused quartz0.5[17]
    Silicon crystal3.6[18]
    Alumina crystal7.3–8.1[18]
    SiO2 coating prepared by EBE0.4[19]
    Table 3. Coefficients of Thermal Expansion of the Substrates and Coating
    Yun Cui, Hao Li, Kui Yi, Jianda Shao. Moisture absorption characteristics of a SiO2 film from 2 to 3 μm[J]. Chinese Optics Letters, 2015, 13(2): 023101
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