• Acta Optica Sinica
  • Vol. 21, Issue 6, 673 (2001)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Strong UV Reflecting Characteristics of Cu/Ti Superlattic Films[J]. Acta Optica Sinica, 2001, 21(6): 673 Copy Citation Text show less

    Abstract

    One-dimensional and two-component Cu/Ti superlattice films have been deposited by DC magnetron sputtering. The influences of substrate temperature, periodic number and substrate structure on UV-reflectivity of Cu/Ti superlattic films are studied. The films fabricated at 470 ℃ substrate temperature, on Si(100) substrate and with 30 pair layers have a high UV-reflectivity of about 90% at 200 nm and 5° from normal incidence.
    [in Chinese], [in Chinese], [in Chinese]. Strong UV Reflecting Characteristics of Cu/Ti Superlattic Films[J]. Acta Optica Sinica, 2001, 21(6): 673
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