• Acta Physica Sinica
  • Vol. 68, Issue 11, 113101-1 (2019)
Guang-Zhen Dai1, Yong-Zhao Jiang1、*, Tian-Ming Ni1, Xin Liu1, Lin Lu1, and Qi Liu2
Author Affiliations
  • 1College of Electrical Engineering, Anhui Polytechnic University, Wuhu 241000, China
  • 2Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China
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    DOI: 10.7498/aps.68.20181995 Cite this Article
    Guang-Zhen Dai, Yong-Zhao Jiang, Tian-Ming Ni, Xin Liu, Lin Lu, Qi Liu. First principles study of effect of vaiable component Al on HfO2 resistance [J]. Acta Physica Sinica, 2019, 68(11): 113101-1 Copy Citation Text show less
    HfO2 defect supercell model: (a) Sub-Al doping into HfO2 containing VO; (b)−(f) Int-Al doping into HfO2 containing VO, the number of Int-Al is 1 to 5.HfO2缺陷超胞模型 (a) Sub-Al掺杂到含有VO的HfO2; (b)—(f) Int-Al掺杂含有VO的HfO2, 掺杂Int-Al的个数分别为1—5
    Fig. 1. HfO2 defect supercell model: (a) Sub-Al doping into HfO2 containing VO; (b)−(f) Int-Al doping into HfO2 containing VO, the number of Int-Al is 1 to 5. HfO2缺陷超胞模型 (a) Sub-Al掺杂到含有VO的HfO2; (b)—(f) Int-Al掺杂含有VO的HfO2, 掺杂Int-Al的个数分别为1—5
    Formation energy of impurity Al, The illustration shows the existence of impurity Al. The dotted circle indicates the formation after losing an O atom.杂质Al的形成能 (插图中显示了杂质Al的存在方式, 虚线圆表示失去一个O原子后形成的VO)
    Fig. 2. Formation energy of impurity Al, The illustration shows the existence of impurity Al. The dotted circle indicates the formation after losing an O atom.杂质Al的形成能 (插图中显示了杂质Al的存在方式, 虚线圆表示失去一个O原子后形成的VO)
    Int-Al formation energy in VO deficient HfO2 system, the illustration shows the partial wave charge density of Int-Al and VO at different pitches.VO缺陷HfO2体系中Int-Al形成能 (插图显示了Int-Al与VO不同间距的分波电荷态密度)
    Fig. 3. Int-Al formation energy in VO deficient HfO2 system, the illustration shows the partial wave charge density of Int-Al and VO at different pitches. VO缺陷HfO2体系中Int-Al形成能 (插图显示了Int-Al与VO不同间距的分波电荷态密度)
    The partial wave charge density of Int-Al systems with different concentrations: (a) 1.04%; (b) 2.06%; (c) 3.06%; (d) 4.04%; (e) 5%.不同浓度Int-Al体系的分波电荷态密度图 (a) 1.04%; (b) 2.06%; (c) 3.06%; (d) 4.04%; (e) 5%
    Fig. 4. The partial wave charge density of Int-Al systems with different concentrations: (a) 1.04%; (b) 2.06%; (c) 3.06%; (d) 4.04%; (e) 5%.不同浓度Int-Al体系的分波电荷态密度图 (a) 1.04%; (b) 2.06%; (c) 3.06%; (d) 4.04%; (e) 5%
    The partial wave charge density equipotential surface value of variable component Int-Al doped VO defect HfO2 system. The illustration shows the formation energy of Int-Al and VO co-doping.变组分Int-Al掺杂VO缺陷HfO2体系的分波电荷密度等势面值, 插图为Int-Al与VO共掺时的形成能
    Fig. 5. The partial wave charge density equipotential surface value of variable component Int-Al doped VO defect HfO2 system. The illustration shows the formation energy of Int-Al and VO co-doping. 变组分Int-Al掺杂VO缺陷HfO2体系的分波电荷密度等势面值, 插图为Int-Al与VO共掺时的形成能
    The partial wave charge density of in HfO2 defect supercell lattice with invariant lattice structure.HfO2缺陷超胞晶格结构不变的分波电荷态密度
    Fig. 6. The partial wave charge density of in HfO2 defect supercell lattice with invariant lattice structure. HfO2缺陷超胞晶格结构不变的分波电荷态密度
    晶格参数ɑ/nm b/nm c/nm β/(°)
    计算值[38]0.51370.519500.5309099.7760
    实验值[39]0.51190.516900.5297099.1800
    本文扩展超胞1.02361.037141.0568299.3523
    本文原胞(= 超胞晶格参数/20)0.51180.518570.5284199.3523
    Table 1. m-HfO2 lattice constants.
    Guang-Zhen Dai, Yong-Zhao Jiang, Tian-Ming Ni, Xin Liu, Lin Lu, Qi Liu. First principles study of effect of vaiable component Al on HfO2 resistance [J]. Acta Physica Sinica, 2019, 68(11): 113101-1
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