• Acta Optica Sinica
  • Vol. 42, Issue 13, 1331001 (2022)
Kaihao Xue1, Huan Liu2, Yongqiang Pan2, and Jun Han1,*
Author Affiliations
  • 1School of Armament Science and Technology, Xi'an Technological University, Xi'an 710021, Shaanxi , China
  • 2School of Opto-Electronic Engineering, Xi'an Technological University, Xi'an 710021, Shaanxi , China
  • show less
    DOI: 10.3788/AOS202242.1331001 Cite this Article Set citation alerts
    Kaihao Xue, Huan Liu, Yongqiang Pan, Jun Han. Transparent Conductive Silver Nanowire Films in Wide Spectrum[J]. Acta Optica Sinica, 2022, 42(13): 1331001 Copy Citation Text show less
    Schematic diagram of AgNW film prepared by spin coating method
    Fig. 1. Schematic diagram of AgNW film prepared by spin coating method
    Sheet resistance of AgNW film with different spin coating rates
    Fig. 2. Sheet resistance of AgNW film with different spin coating rates
    Non-uniformity factor of AgNW film with different spin coating rates
    Fig. 3. Non-uniformity factor of AgNW film with different spin coating rates
    Sheet resistance of AgNW film with different concentration parameters (illustration shows schematic diagram of different measuring points)
    Fig. 4. Sheet resistance of AgNW film with different concentration parameters (illustration shows schematic diagram of different measuring points)
    Transmittance of AgNW film with different concentration parameters
    Fig. 5. Transmittance of AgNW film with different concentration parameters
    SEM image of AgNW film with different concentration parameters. (a) 0.5 mg/mL; (b) 1.0 mg/mL; (c) 1.5 mg/mL;(e) 2.5 mg/mL;(f) 3.0 mg/mL(d) 2.0 mg/mL; (e) 2.5 mg/mL; (f) 3.0 mg/mL
    Fig. 6. SEM image of AgNW film with different concentration parameters. (a) 0.5 mg/mL; (b) 1.0 mg/mL; (c) 1.5 mg/mL;(e) 2.5 mg/mL;(f) 3.0 mg/mL(d) 2.0 mg/mL; (e) 2.5 mg/mL; (f) 3.0 mg/mL
    FOM of AgNW film with different concentration parameters
    Fig. 7. FOM of AgNW film with different concentration parameters
    Schematic diagram of AgNWs processed by thermal annealing
    Fig. 8. Schematic diagram of AgNWs processed by thermal annealing
    Sheet resistance of AgNW film with different annealing temperatures
    Fig. 9. Sheet resistance of AgNW film with different annealing temperatures
    Transmittance of AgNW film with different annealing temperatures
    Fig. 10. Transmittance of AgNW film with different annealing temperatures
    Planar SEM images of AgNW films after thermal annealing. (a) SEM diagram at annealing temperature of 50 ℃; (b) SEM diagram at annealing temperature of 100 ℃; (c) SEM diagram at annealing temperature of 150 ℃; (d) SEM diagram at annealing temperature of 200 ℃; (e) SEM diagram at annealing temperature of 250 ℃; (f) SEM diagram at annealing temperature of 300 ℃; (g) SEM detail diagram of AgNW junction at annealing temperature of 150 ℃; (h) SEM detail diagram of AgNW junction at annealing temperature of 200 ℃; (i) SEM detail diagram of AgNW junction at annealing temperature of 250 ℃
    Fig. 11. Planar SEM images of AgNW films after thermal annealing. (a) SEM diagram at annealing temperature of 50 ℃; (b) SEM diagram at annealing temperature of 100 ℃; (c) SEM diagram at annealing temperature of 150 ℃; (d) SEM diagram at annealing temperature of 200 ℃; (e) SEM diagram at annealing temperature of 250 ℃; (f) SEM diagram at annealing temperature of 300 ℃; (g) SEM detail diagram of AgNW junction at annealing temperature of 150 ℃; (h) SEM detail diagram of AgNW junction at annealing temperature of 200 ℃; (i) SEM detail diagram of AgNW junction at annealing temperature of 250 ℃
    Mass concentration /(mgmL-1Transmittance at 550 nm /%Transmittance in 0.4-2.5 μm /%Transmittance in 3.0-5.0 μm /%Transmittance at 10.0 μm /%Transmittance in 8.0-10.5 μm /%
    0.588.687.683.880.080.8
    1.088.386.178.262.864.9
    1.587.783.972.049.552.5
    2.085.280.067.245.548.3
    2.582.776.162.341.544.1
    3.081.274.160.237.740.3
    Table 1. Transmittance of AgNW film with different concentration parameters in wide spectrum