Grating-based X-ray differential phase contrast imaging has great advantages of detecting the low- Z materials compared with conventional X- ray absorption imaging. It has potential applications in the field of materials, security and medical diagnostics. The fabrication process of absorption grating which is a critical optical component in the system is difficult and costly, and the absorption grating cannot completely absorb high- energy X- rays that results in the decrease of image contrast and detection sensitivity, which has been a great obstacle for the practical application. In view of above problems, a low cost and high efficiency approach based on Bi-source grating and structured scintillator is proposed. The scintillator overcomes the limitation of high- energy X- rays and proposes the function of analyzer grating. This approach obtains high quality phase contrast image experimentally.