Qiwen Zhang, Qinghua Liang, Huijun Guo, Honglei Chen, Ruijun Ding. Research on testing of active and passive HgCdTe APD detector in linear mode[J]. Infrared and Laser Engineering, 2021, 50(6): 20200460
- Infrared and Laser Engineering
- Vol. 50, Issue 6, 20200460 (2021)
Fig. 1. (a) APD readout circuit Unit structure; (b) APD readout circuit working sequence
Fig. 2. System of circuit test
Fig. 3. Labview software design front panel and parameter setting
Fig. 4. Test method flow
Fig. 5. System noise test
Fig. 6. Ramp generator fixed time delay
Fig. 7. DetectorI /V test results
Fig. 8. Test results of HgCdTe APD intensity information
Fig. 9. (a) Circuit test sequence; (b) HgCdTe APD detector and circuit coupling test results
Fig. 10. Ramp slope
Fig. 11. V 2d, V 3d sampling results and TOF calculation results
Fig. 12. RMS results of TOF under multiple collections
Fig. 13. TOF test results under different ramp delays and slopes
|
Table 1. Geiger and linear mode APD performance comparsion
|
Table 2. Readout circuit performance parameters
|
Table 3. Instrument parameters
|
Table 4. Circuit test conditions
|
Table 5. Performance parameters that affect TOF resolution
|
Table 6. Comparison of the proposed work with the Sofradir test platform and test results
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20