Design and research of constant percussive force atomic force microscope in tapping mode

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 1 >Page 40 > Article

Opto-Electronic Engineering
Vol. 31, Issue 1, 40 (2004)

Design and research of constant percussive force atomic force microscope in tapping mode

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design and research of constant percussive force atomic force microscope in tapping mode[J]. Opto-Electronic Engineering, 2004, 31(1): 40 Copy Citation Text

show less

References

[2] ZHONG Q,INNISS D,KJOLLER K,et al. Fractured polymer / silica fiber surface studied by tapping mode atomic force microscopy [J]. Surface Science Letters, 1993, 290(1-2):688-692.

[3] WANG Lu-gen. The role of damping in phase imaging in tapping mode atomic force microscopy [J]. Surface Science, 1998, 429(1-3): 178-185.

[5] ANCZYKOWSKI B,KRUGER D,FUCHS H. Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J]. Physical Review B, 1996,53(23):15485-15488.

[6] KATO N,KIKUTA H,NAKANO T,et al. System analysis of the force-feedback method for force curve measurements[J]. Review of Science Instruments, 1999, 70 (5): 2402-2407.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design and research of constant percussive force atomic force microscope in tapping mode[J]. Opto-Electronic Engineering, 2004, 31(1): 40

Download Citation

Tools

Save the article for my favorites

Paper Information