• Opto-Electronic Engineering
  • Vol. 36, Issue 6, 103 (2009)
HU Jun-hua*, XU Shou-shi, CHEN Hai-ling, and ZHANG Zhen
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2009.06.021 Cite this Article
    HU Jun-hua, XU Shou-shi, CHEN Hai-ling, ZHANG Zhen. Local Invariant Feature Extraction Base on Salient Measurement of Second Moment Matrix[J]. Opto-Electronic Engineering, 2009, 36(6): 103 Copy Citation Text show less
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    HU Jun-hua, XU Shou-shi, CHEN Hai-ling, ZHANG Zhen. Local Invariant Feature Extraction Base on Salient Measurement of Second Moment Matrix[J]. Opto-Electronic Engineering, 2009, 36(6): 103
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