[1] Viegas D, Abad S, Santos J L. Measurement Science and Technology, 2010, 21(9): 094002.
[3] Wada D, Murayama H, Igawa H. Smart Materials and Structures, 2011, 20(8): 085028.
[4] Noritomo Hirayama, Yasukazu Sano. ISA Transactions, 2000, 39(2): 169.
[7] Ferreira M S, Vieira J, Frias C. Measurement Science and Technology, 2011, 22(4): 045206.
[8] Chong S S, Chong W Y. Optics & Laser Technology, 2012, 44: 821.
[9] Iodice M, Striano V, Cappuccino G. IEEE Xplore Restrictions Apply, 2010, 3: 1.
[11] Martin Leich, Julia Fiebrandt, Anka Schwuchow. Optics Communications, 2012, 285(21): 4387.