The totally reflected beam by a dielectric interface actually exhibits a lateral shift from the position of geometric reflection in the plane of incidence, and a transverse shift normal to the plane of incidence. The lateral and transverse shift of an arbitrarily polarized beam is investigated by the improved energy flux method. It is shown that the lateral shift is independent of the phase difference of the TE and TM components of the incident beam, but closely associated with the light intensity of the two components, and its form can be expressed as weighed average of the shifts of the TE and TM polarized beam in accordance with their light intensity. The transverse shift is not only dependent on the light intensity of the two components, but also closely asscociated with the phase difference of the components. Besides, whether the incident beam is elliptically polarized or linearly polarized( with polarization state other than TE or TM), the reflected beam will exhibit a transverse shift.