• Acta Photonica Sinica
  • Vol. 49, Issue 12, 216 (2020)
Dong-mei LIU1, Bo-yang WEI1、*, Xiu-hua FU1, Jing ZHANG1, Suo-tao DONG1, and Shuang LI2
Author Affiliations
  • 1College of Photoelectric Engineering, Changchun University of Science and Technology, Changchun30022, China
  • 2Optorun (Shanghai) Co., Ltd., Shanghai00444,China
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    DOI: 10.3788/gzxb20204912.1231001 Cite this Article
    Dong-mei LIU, Bo-yang WEI, Xiu-hua FU, Jing ZHANG, Suo-tao DONG, Shuang LI. Development of Polycarbonate High Strength Ultra-low Reflectivity Film[J]. Acta Photonica Sinica, 2020, 49(12): 216 Copy Citation Text show less

    Abstract

    In order to reduce the problem of image quality degradation caused by stray light in the optical system, polycarbonate is used as the substrate and the electron beam ion assisted method is used to prepare the ultra-low attenuation reflective film in visible band. Vacuum annealing method was used to reduce the thermal tensile stress caused by the increase of substrate temperature in the coating process, and MATLAB software was used to fit and analyze the stress of the material. By studying the ion source deposition process, the problem of film cracking was solved. MATLAB simulation was used to adjust the control parameters of Proportion Integration Differentiation(PID) controller , so as to stabilize the film-forming rate and solve the problem of spectral drift caused by thickness error. The results show that the absolute reflectance of the film is less than 0.15% at 430 ~ 700 nm.
    Dong-mei LIU, Bo-yang WEI, Xiu-hua FU, Jing ZHANG, Suo-tao DONG, Shuang LI. Development of Polycarbonate High Strength Ultra-low Reflectivity Film[J]. Acta Photonica Sinica, 2020, 49(12): 216
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