Author Affiliations
1National Key Laboratory of Science and Technology on Tunable Laser, Harbin Institute of Technology, Harbin 150080, China2Heilongjiang Institute of Technology, Harbin 150050, Chinashow less
Fig. 1. Schematic of the STIL system. (a) Schematic of the data collection process. (b) The work principle of the streak array detector. (c) The streak image on the CCD.
Fig. 2. Optical emission part of the three-laser-beam STIL system.
Fig. 3. Streak image of a simple plane.
Fig. 4. Error between the calculated value and theoretical value.
Fig. 5. Distance error with the theoretical distance.
Fig. 6. (a) Schematic of the three-laser-beam STIL system. (b) The streak signal of Beam A, Beam B, and Beam C on the CCD.
Fig. 7. (a) Photograph of the model. (b) Size of the base. The unit is millimeters. (c) Heights of “H”, “I”, “T”, and “!”. They are 2, 5, 10, and 20 mm, respectively.
Fig. 8. Results of the 3D imaging experiment. Different colors are used to represent distances. (a) The image obtained using only Beam A, (c) the image obtained using Beam A and Beam B, and (e) the image obtained using Beam A, Beam B, and Beam C. (b), (d), and (f) are the cutaway drawings of (a), (c), and (e) near the blue line separately.
Parameter | Value |
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Wavelength of the laser | 532 nm | Repetition rate of the laser | 1000 Hz | Pulse width of the laser | 1 ns | Power of the laser | | CCD resolution(spatial-resolved time-resolved) | | CCD grayscale | 0–255 | Time bin size, | 0.066 ns | Target distance | | Jitter of DG645 | | Jitter of sweep voltages | | Jitter of the laser output | | Field-of-view | |
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Table 1. Parameters of the STIL System