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    Journals >Opto-Electronic Engineering >Volume 36 >Issue 11 >Page 1 > Article
    • Opto-Electronic Engineering
    • Vol. 36, Issue 11, 1 (2009)
    Optoelectronic Method for Measuring the Deformation on Large-scale Platform
    HUO Hong-fa*, LI Ming, JIANG Yang, YANG Jun, and LIANG Zhi-gang
    Author Affiliations
  • [in Chinese]
    • show less
    DOI: 10.3969/j.issn.1003-501x.2009.11.001 Cite this Article
    HUO Hong-fa, LI Ming, JIANG Yang, YANG Jun, LIANG Zhi-gang. Optoelectronic Method for Measuring the Deformation on Large-scale Platform[J]. Opto-Electronic Engineering, 2009, 36(11): 1 Copy Citation Text show less
    References

    [1] Thomas G Beckwith,Roy D Marangoni,John H Lienhard V. Mechanical Measurements (Fifth Edition) [M]. Wesley Longman,1993.

    [2] WANG Bo-xiong,WANG Xue,CHEN Fei-fan. Engineering Measurement Technology [M]. Beijing:Tsinghua University Press,2006.

    [3] WANG Qing-you. Applications of optoelectronic sensor [M]. Beijing:China machine press,2007

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    HUO Hong-fa, LI Ming, JIANG Yang, YANG Jun, LIANG Zhi-gang. Optoelectronic Method for Measuring the Deformation on Large-scale Platform[J]. Opto-Electronic Engineering, 2009, 36(11): 1
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