[1] Bao Yi, Hoehler S. Matthew, Smith M. Christopher, Bundy Matthew and Chen Genda, Smart Materials and Structures 26, 29230083 (2017).

[2] Marc Nikles, Luc Thevenaz and Philippe A. Robert, Optics Letters 21, 758 (1996).

[3] Yosuke Mizuno, Neisei Hayashi and Kentaro Nakamura, Electronics Letters 50, 1153 (2014).

[4] Yang Zhi-sheng, Hong Xiao-bin, Wu Jian, Guo Hong-xiang and Lin Jin-tong, Applied Physics Express 6, 2502 (2013).

[5] Zhang Xu-ping, Hu Jun-hui and Zhang Yi-xin, Journal of Lightwave Technology 31, 1954 (2013).

[6] Cui Qingsong, Pamukcu Sibel and Pervizpour Mesut, Sensors 15, 8163 (2015).

[7] Cui Qing-song, Pamukcu Sibel, Lin Ao-xiang, Xiao Wen, Herr Douglas, Toulouse Jean and Pervizpour Me-sut, IEEE Sensors Journal 11, 399 (2011).

[8] Liu Jia, Su Yi, Lv Li-dong, Liang Yun and Zhang Zi-jia, Journal of Optoelectronics·Laser 27, 498 (2016). (in Chinese)

[9] He Zu-yuan, Kazama Takushi, Koshikiya Yusuke, Fan Xin-yu, Ito Fumihiko and Hotate Kazuo, Optics Express 19, 764 (2011).

[10] Kaoru Shimizu, Tsuneo Horiguchi and Yahei Koyamada, Journal of Lightwave Technology 10, 982 (1992).

[11] Peter C. Wait and Trevor P. Newson, Optics Communi-cation 131, 285 (1996).

[12] Peter C. Wait and Arthur H. Hartog, Electronics Letters 13, 508 (2001).

[13] Lu Li-dong, Song Yue-jiang, Zhu Fan and Zhang Xu-ping, Optics and Lasers in Engineering 50, 1735 (2012).

[14] Hisashi Izumita, Yahei Koyamada, Shin-uchi Furukawa and Izumi Sankawa, Journal of Lightwave Technology 15, 267 (1997).

[15] Hiroyuki Iida, Yusuke Koshikiya, Fumihiko Ito, Kuni-aki Tanaka, Journal of Lightwave Technology 30, 1121 (2012).

[16] Zhang Xu-ping, Qiao Wei-yan, Sun Zhen-hong, Shan Yuan-yuan, Zeng Jie and Zhang Yi-xin, Optoelectronics Letters 12, 375 (2016).

[17] K De Souza, Measurement Science and Technology 17, 1065 (2006).