• Acta Optica Sinica
  • Vol. 39, Issue 2, 0231001 (2019)
Guojun Jin**, Kai Xu, Jun Tan, Lingli Wang, and Yanlong Meng*
Author Affiliations
  • College of Optical and Electronic Technology, China Jiliang University, Hangzhou, Zhejiang 310018, China
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    DOI: 10.3788/AOS201939.0231001 Cite this Article Set citation alerts
    Guojun Jin, Kai Xu, Jun Tan, Lingli Wang, Yanlong Meng. Encapsulation Structure of Gradient Refractive Index with Ultralow Reflectance[J]. Acta Optica Sinica, 2019, 39(2): 0231001 Copy Citation Text show less
    System structure of inductively coupled plasma enhanced chemical vapor deposition
    Fig. 1. System structure of inductively coupled plasma enhanced chemical vapor deposition
    AFM images of different samples. (a) D1; (b) D2; (c) D3; (d) D4
    Fig. 2. AFM images of different samples. (a) D1; (b) D2; (c) D3; (d) D4
    Refractive index of SiO2 thin film
    Fig. 3. Refractive index of SiO2 thin film
    Structure of perovskite cell encapsulated by SiO2 multi-films with gradient refractive index
    Fig. 4. Structure of perovskite cell encapsulated by SiO2 multi-films with gradient refractive index
    Reflectance of perovskite cells with different encapsulation structures
    Fig. 5. Reflectance of perovskite cells with different encapsulation structures
    Transmittance of perovskite cells with different encapsulation structures
    Fig. 6. Transmittance of perovskite cells with different encapsulation structures
    SamplesUp-RF power /WDown-RF power /WPressure /Pa
    D15007054.989
    D250010055.021
    D350015054.949
    D450020055.021
    D550025055.119
    Table 1. Preparation conditions of SiO2 thin film in different groups
    Guojun Jin, Kai Xu, Jun Tan, Lingli Wang, Yanlong Meng. Encapsulation Structure of Gradient Refractive Index with Ultralow Reflectance[J]. Acta Optica Sinica, 2019, 39(2): 0231001
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