• Acta Optica Sinica
  • Vol. 22, Issue 8, 924 (2002)
[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Direct Coupling for Double Metal-Cladding Waveguides[J]. Acta Optica Sinica, 2002, 22(8): 924 Copy Citation Text show less
    References

    [1] Ulrich R. Theory of prism-film coupler by plane-wave analysis. J. Opt. Soc. Am., 1970, 60(10):1337~1349

    [2] Tamir T, Peng S T. Analysis and design of grating couplers. Appl. Phys., 1977, 14(3):235~253

    [3] Boya J T, Anderson D B. Radiation pattern of an end-fire optical waveguide coupler. Opt. Commun., 1975, 13(3):353~358

    [4] Tien P K, Martin R J. Experiments on light waves in a thin tapered film and a new lightwave coupler. Appl. Phys. Lett., 1971, 18(9):398~400

    [5] Jiang Yi, Cao Zhuangqi. Low voltage electro-optical polymer light modulator using attenuated total internal reflection. Opt. and Laser Technol., 2001, 33(9):417~420

    [6] Jiang Yi, Cao Zhuangqi. Improved attenuated-total-reflection technique for measuring the electro-optic coefficients of nonlinear optical polymers. J. Opt. Soc. Am. (B), 2000, 17(5):805~808

    [7] Cao Zhuangqi. Transfer Matrix Method in Guidewave Optics. Shanghai: Shanghai Jiaotong University Press, 2000. Chap.9

    [8] Chen W P, Chen J M. Use of surface plasma waves fore determination of the thickness and optical constants of thin metallic films. J. Opt. Soc. Am., 1981, 71(2):189~191

    [9] Schulz L G. The optical constants of silver, gold, copper, and aluminum . Ⅰ. The absorption coefficient k. J. Opt. Soc. Am., 1954, 44(5):357~362

    [10] Schulz L G, Tancherlini F R. The optical constants of silver, gold, copper, and aluminum. Ⅱ. The index of refraction n. J. Opt. Soc. Am., 1954, 44(5):362~368

    CLP Journals

    [1] Zhou Jinzhao, Song Yajie, Zeng Xianyou, Wang Zebin, Huang Zuohua. Thin Film Parameters Based on Polarized Light Reflected from the Multi-Point Measurement[J]. Chinese Journal of Lasers, 2012, 39(12): 1207002

    [2] Zhou Jinzhao, Yu Wenfang, Huang Zuohua. Polarized Light Reflection Method for Measuring Thin Film Parameters[J]. Laser & Optoelectronics Progress, 2012, 49(12): 121201

    [3] Zhou Jinzhao, Huang Zuohua, Zeng Xianyou, Zhang Yong. Simultaneous Measurement of Prism and Waveguide Film Parameters by Waveguide Technology[J]. Acta Optica Sinica, 2012, 32(12): 1212001

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Direct Coupling for Double Metal-Cladding Waveguides[J]. Acta Optica Sinica, 2002, 22(8): 924
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