[1] Nicodemus F E, Hsia J C. National Bureau of Standards (U. S. )
Monograph, 1977.
[2] Robert L Cook, Kenneth E Torrance. ACM Tansactions on Graphic,
1982, 1(1): 7.
[3] Thilak V, Creusere C D, Voelz D G. Image Processing. ICIP. IEEE
International Conference on, 2007, 4: 121.
[4] Proceedings. International Conference, 2003, 3: 327.
Zallat J, Grabbling P, Takakura Y. Image Processing. ICIP.
[5] Intelligence, 1990, 12(11): 1059.
Wolff L B. IEEE Transactions on Pattern Analysis and Machine
[6] Hua Chen, Lawrence B Wolff. International Journal of Computer
Vision 1998, 28(1): 73.
[8] ZHAO Yong-qiang, GONG Peng, PAN Quan. IEEE Transactions on
Geoscience and Remote Sensing, 2008, 46(10): 3337.
[10] Feng Weiwei, Wei Qingnong. Infrared Physics & Technology, 2008, 51
(6): 559.
[13] Madsen K, Nielsen H B, Tingleff O. Informatics and Mathematical
Modelling, Technical University of Denmark, DTU, 2004, 24.
[15] International Society for Optical Engineering, 2005, 5811: 34.
Shell James R, Schott John R. Proceedings of SPIE, the
[19] 988.
Richard G Priest, Steven R Meier. Optical Engineering, 2002, 41(5):
[20] America, 1967, 57(9): 1105.
Torrance K E, Sparrow E M. Journal of the Optical Society of