• Laser & Optoelectronics Progress
  • Vol. 58, Issue 18, 1811026 (2021)
Jiangyong Li*, Miaoyan Wang, and Chang Ben
Author Affiliations
  • North China Research Institute of Electro-Optics, Beijing 100015, China
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    DOI: 10.3788/LOP202158.1811026 Cite this Article Set citation alerts
    Jiangyong Li, Miaoyan Wang, Chang Ben. Evaluation of Distributed Optoelectronic System Properties[J]. Laser & Optoelectronics Progress, 2021, 58(18): 1811026 Copy Citation Text show less

    Abstract

    Distributed optoelectronics solves the contradiction between large field of view and high resolution, which is widely used in military reconnaissance, security monitoring, astronomical observation, and other fields. The distributed optoelectronic system improves the image quality through imaging stitching and super-resolution reconstruction, thereby enhancing the detection and recognition capability. However, there is still a lack of systematic evaluation method for distributed optoelectronic systems. This article establishes a quantitative evaluation method for distributed optoelectronic systems. Firstly, we study the theory of distributed optoelectronic systems and the image processing algorithms. Then the image quality is evaluated by analyzing the spatial resolution, signal-to-noise ratio, information entropy, and other parameters. Finally, the theoretical analysis of the detection and recognition capability is carried out from perspectives of optoelectronic systems and image quality. This paper provides important theoretical support for the development of distributed optoelectronic technology.
    Jiangyong Li, Miaoyan Wang, Chang Ben. Evaluation of Distributed Optoelectronic System Properties[J]. Laser & Optoelectronics Progress, 2021, 58(18): 1811026
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