• Opto-Electronic Engineering
  • Vol. 35, Issue 9, 27 (2008)
ZHOU Shao-lin1、2、*, CHEN Wang-fu1、2, YANG Yong1、2, TANG Xiao-ping1, HU Song1, MA Ping1, YAN Wei1, and ZHANG You-lin3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    ZHOU Shao-lin, CHEN Wang-fu, YANG Yong, TANG Xiao-ping, HU Song, MA Ping, YAN Wei, ZHANG You-lin. Alignment Model of Moiré and its Application in Nanometer Lithography[J]. Opto-Electronic Engineering, 2008, 35(9): 27 Copy Citation Text show less
    References

    [1] Lord Raleigh.On the manufacture and theory of diffraction gratings[J].Phil.Mag.Ser,1874,47:193-205

    [2] Lord Raleigh.On copying diffraction-gratings,and on some phenomena connected therewith[J].Phil.Mag.Ser,1881,11:196-205

    [3] King M C,Berry D H.Photolithographic mask alignment using moire techniques[J].J.Vae.Sei.Technol B,1972,11:2455-2458

    [4] Uchida Y,Hattori S,Nomura T.An automatic mask alignment technique using Moiré interference[J].J.Vac.Sci.Technol B,1987,5:244-247

    [5] Nishijima Y,Oster G Moiré Patterns:Their Application to Refractive Index and Refractive Index Gradient Measurements[J].J.Opt.Soc.Am.A,1964,54:1-5

    [7] McIlraith A H.The physics of moiré fringes[J].Phy.Edue,1970,5:106-112

    [9] OsterG,Wasserman M,Zwerling C.Theorctical Interpretation of Moiré Pattems[J].J.Opt.Soc.Am.A,1964,54:169-175

    [10] ZHOU Shao-lin,FU Yong-qi,TANG Xiao-ping,et al.Fourier-based analysis of moiré fringe patterns of superposed gratings in alignment of nanolithography[J].Opt.Express,2008,16:7869-7880

    CLP Journals

    [1] Yang Xiaoming, Zheng Sanchao, Huang Gaokun, Zhou Sumei. Fourier Transform of 2D Moiré Fringe[J]. Laser & Optoelectronics Progress, 2017, 54(9): 92302

    ZHOU Shao-lin, CHEN Wang-fu, YANG Yong, TANG Xiao-ping, HU Song, MA Ping, YAN Wei, ZHANG You-lin. Alignment Model of Moiré and its Application in Nanometer Lithography[J]. Opto-Electronic Engineering, 2008, 35(9): 27
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