• Chinese Journal of Quantum Electronics
  • Vol. 20, Issue 5, 599 (2003)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Accuracy Analysis of Optic Current Sensor Head With Dual-layer Circuit[J]. Chinese Journal of Quantum Electronics, 2003, 20(5): 599 Copy Citation Text show less

    Abstract

    The accuracy of optic current sensor with dual-layer circuit has been analyzed in this paper. The results indicate that the sensor head adopting small index of material and large incident angle will reduce requirement of machining accuracy. The influences of the manufacturing error of sensor heads with dual-layer circuit method and critical angle method have been compared as well, the manufacturing accuracy required by the former method is lower than that of the latter method.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Accuracy Analysis of Optic Current Sensor Head With Dual-layer Circuit[J]. Chinese Journal of Quantum Electronics, 2003, 20(5): 599
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