Author Affiliations
School of Electronics and Information Engineering, Lanzhou Jiaotong University, Lanzhou , Gansu 730030, Chinashow less
Fig. 1. Schematic of perfect photonic crystal structure. (a) Schematic of perfect lattice; (b) schematic of PCW structure
Fig. 2. Comparison of slow light properties of PCW without and with extrinsic defect rods. (a) GVD versus normalized frequency; (b) group index versus normalized frequency
Fig. 3. Slow light properties affected by the radius in the range of with and fixed at 0.20a. (a) Dispersion curves of guided modes; (b) group index versus normalized frequency; (c) GVD versus normalized frequency
Fig. 4. Slow light properties affected by the radius changing from 0.28a to 0.34a with fixed at 0.14a and fixed at 0.20a. (a) Group velocity versus normalized frequency; (b) group index versus normalized frequency; (c) GVD versus normalized frequency
Fig. 5. Slow light properties affected by the radius changing from 0.24a to 0.28a with fixed at 0.14a and fixed at 0.31a. (a) Dispersion curves of guided modes; (b) group velocity versus normalized frequency; (c) GVD versus normalized frequency
Fig. 6. When , the bandwidth comparison of each radius value. (a) ; (b) ; (c) ; (d)
| | | | | NDBP |
---|
0.11 | 22.4 | 68.2 | 10.57 | 28.46 | 0.1941 | 0.12 | 35.9 | 112.0 | 17.35 | 19.73 | 0.2209 | 0.13 | 47.7 | 152.3 | 23.61 | 14.85 | 0.2262 | 0.14 | 60.4 | 197.3 | 30.59 | 11.73 | 0.2314 | 0.15 | 67.5 | 225.4 | 34.95 | 9.44 | 0.2129 | 0.16 | 80.5 | 274.2 | 42.51 | 7.92 | 0.2173 |
|
Table 1. Slow light properties affected by the radius for and
| | | | | NDBP |
---|
0.28 | 73.7 | 243.4 | 37.73 | 12.49 | 0.3041 | 0.29 | 74.7 | 246.9 | 38.28 | 12.33 | 0.3044 | 0.30 | 80.9 | 267.7 | 41.49 | 12.25 | 0.3281 | 0.31 | 82.0 | 271.6 | 42.09 | 12.09 | 0.3284 | 0.32 | 83.0 | 275.2 | 42.65 | 11.94 | 0.3052 | 0.33 | 84.3 | 279.8 | 43.38 | 10.92 | 0.3056 | 0.34 | 85.7 | 284.9 | 44.16 | 10.74 | 0.3061 |
|
Table 2. Slow light properties affected by the radius for and ,
| | | | | NDBP | GVD() |
---|
0.24 | 50.0 | 169.6 | 26.29 | 18.41 | 0.3123 | -2089.9-2454.8 | 0.25 | 45.1 | 154.0 | 23.86 | 21.98 | 0.3384 | -2096.4-4596.7 | 0.26 | 44.7 | 153.6 | 23.80 | 22.17 | 0.3405 | -2220.4-3988.7 | 0.27 | 43.6 | 150.8 | 23.38 | 24.35 | 0.3671 | -2520.9-4550.5 | 0.28 | 43.3 | 150.8 | 23.37 | 26.16 | 0.3944 | -2174.5-3712.3 |
|
Table 3. Slow light properties affected by the radius for and ,
Type of defect | | | | | NDBP | |
---|
With InP defect | 43.3 | 150.8 | 23.37 | 26.16 | 0.3944 | With Si defect | 27.3 | 100.5 | 15.57 | 18.14 | 0.1823 |
|
Table 4. Comparison of slow light characteristics when introducing InP extrinsic defects and Si intrinsic defects
Structure | | | NDBP |
---|
Proposed structure | 26.16 | 23.37 | 0.3944 | Structurein Ref.[19] | 23.0 | | 0.385 | Structurein Ref.[20] | 24.01 | | 0.2728 | Structurein Ref.[21] | 850 | 0.6689 | 0.378 | Structurein Ref.[22] | 21 | 20.3 | | Structurein Ref.[23] | 20.1 | 23.04 | 0.3083 | Structurein Ref.[24] | 373.4 | 0.068 | | Structurein Ref.[10] | 48 | 12.21 | 0.378 | Structurein Ref.[9] | | | 0.245 | Structurein Ref.[25] | 54.55 | 9.13 | 0.32 |
|
Table 5. , at 1550 nm, and NDBP in different literatures