• Opto-Electronic Engineering
  • Vol. 35, Issue 9, 99 (2008)
HUANG Ying-dong*, LI Jie, and FAN Ning-jun
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    HUANG Ying-dong, LI Jie, FAN Ning-jun. Aerial Image Mosaic Algorithm of MAV[J]. Opto-Electronic Engineering, 2008, 35(9): 99 Copy Citation Text show less
    References

    [1] Jagannadan V,Prakash M C,Sarma R R,et al.Feature extraction and image registration of color images using Fourier bases[J].IEEE Trans on Image Processing,2005,2:657-662

    [3] Tian Guiyun,Gledhill D,Taylor D.Comprehensive Interest Points Based Imaging Mosaic[J].Pattern Recognition Letters,2003,24(9/10):1171-1179

    [4] Reddy B S,Chatterji B N.A FFT-Based Technique for Translation,Rotation,and Scale Invariant Image Registration[J].IEEE Trans on Image Processing,1996,2:5-8

    [5] Rezai-Rad G,Aghababaie M.Comparison of SUSAN and Sobel Edge Detection in MRI Images for Feature Extraction[J].IEEE Information and Communication Technologies,2006,1:1103-1107

    [6] Zhang Y,Rockett P I.The Bayesian Operating Point of the Canny Edge Detector[J].IEEE Trans on Image Processing,2006,15:3409-3416

    [7] Zuliani M,Kenney C,Manjunath B S.A Mathematical Comparison of Point Detectors[D].California,Santa Barbara:Department of Electrical and Computer Engineering,University of California,2004:34-56

    [8] David Peter Capel.Image Mosaicing and Super-resolution[D].Robotics Research Group Department,University of Oxford,2001:80-89

    [9] Gilbert Strang.Linear Algebra and its Appfieations[M].NewYork:Academic Press,1997:40-46

    [10] Fishchler M A.Random Sample Consensus:a paradigm for model fitting with application to image analysis and automated cartography[J].Communication Association Machine,1981,24(6):381-390

    CLP Journals

    [1] CHENG Hong, ZHENG Yue, SUN Wenbang, ZHANG Fengjing. A Seam-line Removal Method Based on Curve Fitting[J]. Opto-Electronic Engineering, 2013, 40(5): 72

    HUANG Ying-dong, LI Jie, FAN Ning-jun. Aerial Image Mosaic Algorithm of MAV[J]. Opto-Electronic Engineering, 2008, 35(9): 99
    Download Citation