[2] Carter F L，Berg P C，Barger W R. Langmuir-Blodgett test structures for molecular electronics-recent trends in Japan [J].Molecular electronic devices(S0160-9114)，1998，78(3)：441-463.

[3] Heng M H. Influence of injection barrier height and morphology on current-voltage characteristics [J]. Applied Physics Letters(S1672-9145)，2003，82(4)：2281-2283.

[4] ZHENG Hua-jing，JIANG Ya-dong，XU Jian-hua，et al. Application of the LB Film Method of PEDOT-PSS in OLED Device[J]. Opto-Electronic Engineering，2010，37(2)：40-44.

[5] Navarro A E，Moustrou C，Brisset H，et al. Characterization of PEDOT film functionalized with a series of automated synthesis ferrocenyl-containing oligonucleotides [J]. Tetrahedron(S0040-4020)，2005，61(5)：3947-3952.

[6] Boudreaux D S，Williams F，Nozik A J. Hot carrier injection at semiconductor-electrolyte junctions [J]. J. of Appl. Phys(S0021-8979)，1980，51(3)：2158-2163.

[7] Meskers S C J，Van Duren J K J，Janssen R A J. Non-linearity in the I-V characteristic of poly (3, 4-ethylenedioxythiophene):poly (styrenesulfonic acid) (PEDOT: PSS) due to joule heating [J]. Organic Electronics(S0266-3244)，2004，81(5)：207-211.

[8] ZHANG J Z. Interfacial charge carrier dynamics of colloidal semiconductor nanoparticles [J]. J. Phys. Chem(S1022-1352)，2000，104：7239-7253.

[9] Martin R O，Kim S，Dain K. In-situ characterization of conducting polymer ultrathin films [J]. Thin Solid Films(S0040-6090)，2004，31(3)：164-171.

[10] Sunel N，Sedef A G，Parlak M，et al. Electronic properties of polymide-PPY/metal junction and electrical conductivity of typical sample at low temperatures [J]. Materials chemistry and Physics(S0254-0584)，2005，91(6)：227-232.