[2] Donald A R, Stuart H, James C, et al. Third generation imaging sensor system concepts[J]. SPIE,1999,3701:108117.
[4] Triboulet R, Heurtel A. and Rioux J. Twin-free (Cd, Mn)Te substrates[J]. Journal of Crystal Growth,1990,101:131134.
[5] Zhang J J, Jie W Q, Wang L J, et al. Twins in CdMnTe single crystals grown by Bridgman method[J]. Crystal Research and Technology,2010,45:712.
[6] Belas E, Bugar M, Grill R, et al. Reduction of inclusions in (CdZn)Te and CdTe: In single crystals by post-growth annealing[J]. Journal of Electronic Materials,2008,37(9):12121218.
[8] Nakagawa K, Maeda K, Takeuchi S. Observation of dislocations in cadmium telluride by cathodoluminescence microscopy[J]. Applied Physics Letters,1979,34:574575.
[9] Zhang J J, Jie W Q, Luan L J, et al. Evaluation of Mn uniformity in CdMnTe crystal grown by the vertical Bridgman method[J]. Journal of Electronic Materials,2008,37(8):11581162.
[10] Zaets W, Watanabe K, Ando K. Cd1-xMnxTe magneto-optical waveguide integrated on GaAs substrate[J]. Applied Physics Letters,1997,70:25082510.
[11] Urbach F. The long-wavelength edge of photographic sensitivity and of the electronic absorption of solids[J]. Physics Review,1953,92:1324.
[12] Andr R, Dang L S. Low-temperature Refractive Indices of Cd1-xMnxTe and Cd1-xMgxTe [J]. Journal of Applied Physics,1997,82(10):50865089.