Planeness measuring system of solar panel substrate by an optical triangulation method

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 31 >Issue 2 >Page 113 > Article

Infrared and Laser Engineering
Vol. 31, Issue 2, 113 (2002)

Planeness measuring system of solar panel substrate by an optical triangulation method

[in Chinese]^*, [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Planeness measuring system of solar panel substrate by an optical triangulation method[J]. Infrared and Laser Engineering, 2002, 31(2): 113 Copy Citation Text

show less

References

[1] Costa M F M. Surface inspection by an optical triangulation method[J]. Opt. Eng., 1996, 35(9):2743-2747.

[2] Costa M F M, Almeida J B. System of optical non-contact micro-topography[J]. Applied Optics., 1993, 32(25):4860-4863.

[3] Baribeau R, Rioux M. Centroid fluctuations of speckled targets[J]. Applied Optics., 1991, 30(26):3752-3755.

[4] Fang Jiancheng, Zhao Jianhui, Zhu Shiping. Solar panel substrate planeness measuring system by an optical triangulation method[A]. Proceedings of SPIE Optical Measurement and Nondestructive Testing: Techniques and Applications[C]. 2000, 4221. 62-66.

CLP Journals

[1] Yujie Zhang, Lei Xu, Yuqing Guan, Wenzhe Zou, Chuangwei Guo, Lihua Lei, Yunxia Fu, Zhenyan Guo, Zhenjie Gu, Xiao Deng. Research on laser self-mixing nano-displacement measurement based on plane reflective holographic grating[J]. Infrared and Laser Engineering, 2023, 52(4): 20220676

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Planeness measuring system of solar panel substrate by an optical triangulation method[J]. Infrared and Laser Engineering, 2002, 31(2): 113

Download Citation

Tools

Save the article for my favorites

Paper Information