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    Journals >Acta Optica Sinica >Volume 34 >Issue 5 >Page 512001 > Article
    • Acta Optica Sinica
    • Vol. 34, Issue 5, 512001 (2014)
    Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis
    Peng Shijun* and Miao Erlong
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    DOI: 10.3788/aos201434.0512001 Cite this Article Set citation alerts
    Peng Shijun, Miao Erlong. Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis[J]. Acta Optica Sinica, 2014, 34(5): 512001 Copy Citation Text show less
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    Peng Shijun, Miao Erlong. Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis[J]. Acta Optica Sinica, 2014, 34(5): 512001
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