Author Affiliations
Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, Chinashow less
Fig. 1. Layout of beam shaping unit
Fig. 2. Schematic of rotation angle characteristic and reflective light path of micromirror
Fig. 3. Flow chart of tolerance analysis of MMA
Fig. 4. Intensity distributions of illumination modes. (a) QI; (b) DI; (c) Zernike
Fig. 5. Exposure results of angle adjustment error for three kinds of illumination modes. (a) QI; (b) DI; (c) Zernike
Fig. 6. Exposure results of process angle error for three kinds of illumination modes. (a) QI; (b) DI; (c) Zernike
Fig. 7. Exposure results for different Δα and Δβ. (a) Angle adjustment error; (b) process angle error
Fig. 8. Cumulative probability distribution of ΔdCD under tolerance
Parameter | Number | Size | Gap | Radius |
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Value | 71×71 | 0.500 mm×0.707 mm | 0.0500 mm×0.0707 mm | +∞ |
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Table 1. Main design specifications of MMA
Parameter | Focus of microlens /mm | Focus of relay condenser /mm | Diameter of pupil plane /mm |
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Value | 164.7 | 1000 | 150 |
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Table 2. Main design specification of other elements
Rotation angle (α, β) /(°) | (0, 0) | (2.12, 0) | (-2.12, 0) | (0, 3) | (0, -3) |
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Center coordinate (x, y) /mm | (0, 0) | (0, -74.23) | (0, 74.23) | (-74.23, 2.25) | (74.23, 2.25) |
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Table 3. Simulation results of angle of micromirror
Illumination mode | CDE /% | ΔdCD /nm |
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QI | 0.96 | 0.269 | DI | 1.06 | 0.297 | Zernike | 0.20 | 0.056 |
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Table 4. Exposure results of ideal illumination mode
Illumination mode | CDE /% | ΔdCD /nm |
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QI | 1.20 | 0.336 | DI | 1.21 | 0.339 | Zernike | 0.28 | 0.078 |
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Table 5. Exposure results of error illumination mode simulated by Matlab
Illumination mode | CDE /% | ΔdCD /nm |
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QI | 1.35 | 0.378 | DI | 1.23 | 0.344 | Zernike | 0.28 | 0.078 |
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Table 6. Exposure results of error illumination mode simulated by LightTools