• Chinese Optics Letters
  • Vol. 15, Issue 3, 032301 (2017)
Weijie Mai1、2, Luna Cui1、2、*, and Li Yu1、2
Author Affiliations
  • 1State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing 100876, China
  • 2School of Science, Beijing University of Posts and Telecommunications, Beijing 100876, China
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    DOI: 10.3788/COL201715.032301 Cite this Article Set citation alerts
    Weijie Mai, Luna Cui, Li Yu. Multimode-interference-based crossing for metal-insulator-metal waveguides[J]. Chinese Optics Letters, 2017, 15(3): 032301 Copy Citation Text show less
    (a) Dispersion relation of MIM waveguide. (b) The field profile (Hy) of the first four TM modes in a 700 nm wide waveguide.
    Fig. 1. (a) Dispersion relation of MIM waveguide. (b) The field profile (Hy) of the first four TM modes in a 700 nm wide waveguide.
    Schematic of the MMI-based crossing.
    Fig. 2. Schematic of the MMI-based crossing.
    Calculated throughput and crosstalk for MMI-based crossing as function of the MMI length Lm. Here, ws=100 nm and Wm=560 nm.
    Fig. 3. Calculated throughput and crosstalk for MMI-based crossing as function of the MMI length Lm. Here, ws=100nm and Wm=560nm.
    Field distribution (Hy) at λ=1550 nm for (a) MIM-based crossing and (b) direct crossing. (c) Throughput (solid lines) and crosstalk (dashed lines) for MIM-based crossing (blue lines) and direct crossing (red lines).
    Fig. 4. Field distribution (Hy) at λ=1550nm for (a) MIM-based crossing and (b) direct crossing. (c) Throughput (solid lines) and crosstalk (dashed lines) for MIM-based crossing (blue lines) and direct crossing (red lines).
    Fabrication tolerance of the proposed MMI-based crossing when there is an MMI waveguide width variation ΔWm.
    Fig. 5. Fabrication tolerance of the proposed MMI-based crossing when there is an MMI waveguide width variation ΔWm.
    Weijie Mai, Luna Cui, Li Yu. Multimode-interference-based crossing for metal-insulator-metal waveguides[J]. Chinese Optics Letters, 2017, 15(3): 032301
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