• Acta Optica Sinica
  • Vol. 26, Issue 5, 720 (2006)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Model Design and Parameter Optimization of Stimulated Emission Depletion Fluorescence Microscopy[J]. Acta Optica Sinica, 2006, 26(5): 720 Copy Citation Text show less
    References

    [3] Marcus Dyba, Stefan W. Hell. Focal spots of size l/23 open up far-field florescence microscopy at 33 nm axial resolution[J]. Phys. Rev. Lett., 2003, 88(16): 163901

    [4] V. Westphal, L. Kastrup, S. W. Hell. Lateral resolution of 28 nm (λ/25) in far-field fluorescence microscopy[J]. Appl. Phys. B, 2003, 77: 377~380

    [6] Stefan W. Hell, Jan Wichmann. Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy[J]. Opt. Lett., 1994, 19(11): 780~782

    [7] Thomas A. Klar, Stefan Jakobs, Marcus Dyba et al.. Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission[J]. PNAS, 2000, 97(15): 8206~8210

    [8] Thomas A. Klar, Egbert Engel, Stefan W. Hell. Breaking Abbe′s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes[J]. Phys. Rev. E, 2001, 64(6): 066613

    [9] Marcus Dyba, Stefan W. Hell. Photostability of a fluorescent marker under pulsed excited-state depletion through stimulated emission[J]. Appl. Opt., 2003, 42(25): 5123~5129

    [10] George E. Cragg, Peter T. C. So. Lateral resolution enhancement with standing evanescent waves[J]. Opt. Lett., 2000, 25(1): 46~48

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Model Design and Parameter Optimization of Stimulated Emission Depletion Fluorescence Microscopy[J]. Acta Optica Sinica, 2006, 26(5): 720
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