[1] D. E. Aspnes, New developmentsins pectroellipsomtry: the challenge of surfaces. Thin Solid Films, 1993, 233(1): 1～8

[2] D. E. Aspnes, A. A. Studna, High precision scanning ellipsometer. Appl. Opt., 1975, 14(2): 220～228

[3] M. Born, E. Wolf, Principles of Optics, Sixth Edition, Pergamon Press, New York, 1980: 24～25

[4] R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light, North-Holland Publishing Co., Amsterdam, 1977: 287～288

[5] P. S. Hauge, F. H. Dill, IBM J. Research & Development, 1973, 17(6): 472～489

[6] C. Kittel, Introduction to Solid State Physics, Sixth Edition, John Wiley & Sons, Inc., New York, 1986: 292～295

[8] D. E. Aspnes, A. A. Studna, Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV. Phys. Rev. (B), 1983, 27(2): 985～1009