• Chinese Journal of Quantum Electronics
  • Vol. 31, Issue 2, 245 (2014)
Wei-lun ZHAO1、*, Juan HE1, Wei NIU2, Zhu YANG3, Jun XIE1, Qi-qi ZHANG1, Yuan-jie GONG1, Yong WANG1, and Yi-yuan XIE1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1007-5461.2014.02.019 Cite this Article
    ZHAO Wei-lun, HE Juan, NIU Wei, YANG Zhu, XIE Jun, ZHANG Qi-qi, GONG Yuan-jie, WANG Yong, XIE Yi-yuan. Formal worst case analysis of insertion loss in Torus-based optical networks-on-chip[J]. Chinese Journal of Quantum Electronics, 2014, 31(2): 245 Copy Citation Text show less
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    ZHAO Wei-lun, HE Juan, NIU Wei, YANG Zhu, XIE Jun, ZHANG Qi-qi, GONG Yuan-jie, WANG Yong, XIE Yi-yuan. Formal worst case analysis of insertion loss in Torus-based optical networks-on-chip[J]. Chinese Journal of Quantum Electronics, 2014, 31(2): 245
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