Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals

LI Rui-hong; HAN Yue-ping; ZHOU Han-chang; HAN Yan

Journals >Spectroscopy and Spectral Analysis >Volume 30 >Issue 8 >Page 2184 > Article

Spectroscopy and Spectral Analysis
Vol. 30, Issue 8, 2184 (2010)

Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals

LI Rui-hong^*, HAN Yue-ping, ZHOU Han-chang, and HAN Yan

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[in Chinese]

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LI Rui-hong, HAN Yue-ping, ZHOU Han-chang, HAN Yan. Measurement Technology for Multi-Parameter Spectral Responsivity of X-Ray Scintillation Crystals[J]. Spectroscopy and Spectral Analysis, 2010, 30(8): 2184 Copy Citation Text

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References

[1] Jan Tous, Martin Horvath, Ladislav Pina, et al. Nucl. Instr. and Meth. A, 2008, 591(1): 264.

[2] Freire L, Calado A, Cardoso J V, et al. Radiation Measurements, 2008, 43(3): 646.

[3] Han Yueping, Han Yan, Li Ruihong. Nucl. Instr. and Meth. A, 2009, 600(2): 440.

[4] Han Yueping, Han Yan, Li Ruihong. Nucl. Instr. and Meth. A, 2009, 604(3): 760.

[5] Valais I, Michail C, David S, et al. Physica Medica, 2008, 24(1): 122.

[8] Hans-Günther Moser. Progress in Particle and Nuclear Physics, 2009, 63(2): 186.

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