Researching | Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li2MnO3 and Li2RuO3

Journals >Journal of Semiconductors >Volume 45 >Issue 4 >Page 042801 > Article

Journal of Semiconductors
Vol. 45, Issue 4, 042801 (2024)

Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li₂MnO₃ and Li₂RuO₃

Peng Zhang^*

Author Affiliations

Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China

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DOI: 10.1088/1674-4926/45/4/042801 Cite this Article

Peng Zhang. Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li₂MnO₃ and Li₂RuO₃[J]. Journal of Semiconductors, 2024, 45(4): 042801 Copy Citation Text

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References

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Peng Zhang. Electronic origin of structural degradation in Li-rich transition metal oxides: The case of Li₂MnO₃ and Li₂RuO₃[J]. Journal of Semiconductors, 2024, 45(4): 042801

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